Used Zeiss C 400 for sale (112)

Year of construction: 2000, condition: excellent (used), Technical data Manufacturer: ZEISS Type: SMM-C Year of construction: 2000 Double-Station CMM Measuring range X = 6000 mm Y = 2 x 1100 mm Z = 2400 mm Equipment Control C99 The machine can be modernized with new accessories according to customer requirements. Price: on request! Installation and commissioning possible! We would be happy to provide you with a detailed offer. Please note: Our offer is directed exclusively to professional customers. (Changes and errors in the technical data, information Pedpfef S A Afsx Aa Esrf and prices and subject to prior sale)

Year of construction: 1999, condition: excellent (used), machine/vehicle number: 105220 & 105221, Technical data Manufacturer: ZEISS Type: SMM-C Year of manufacture: 1999 Double stander CMM Machine number: 105220 & 105221 Measuring plate Stiefelmayer measuring plate X = 6000 mm Y = 3000 mm Equipment ZEISS control system year of construction 2007 The machine can be modernized with new accessories according to customer requirements. Prjdpogi D Nlsfx Aa Esf Price: on request! Assembly and commissioning possible! We will be happy to provide you with a detailed offer. Note: Our offer is directed exclusively at specialist customers. (Changes and errors in the technical data, information and prices as well as and prices as well as subject to prior sale).

Year of construction: 1983, condition: excellent (used), Equipment Touch probe: ZEISS RDS (touch trigger, continuous rotary/swivel unit) CNC control 16Bit Probe changing device: optional Optional various probes on measuring machine The machine can be upgraded with new software according to customer requirements. Measuring range X = 4000 mm Y = 2000 mm Z = 2100 mm Price: on request! Assembly and commissioning possible! Podpfx Ajff Ea Dsa Ejrf We would be happy to provide you with a detailed offer! Please note: Our offer is directed exclusively to professional customers! (Changes and errors in the technical data, information and prices as well as prior sale reserved)

Year of construction: 1998, condition: excellent (used), Technical data Manufacturer: ZEISS / Stiefelmayer Year of construction: 1998 Manual double stand measuring system Measuring plate is centered Psdpfxed Adx Sj Aa Eerf Measuring plate X = 5000 mm Y = 2620 mm Measuring range X = 4400 mm Y = 1200 mm Z = 1800 mm The machine can be upgraded to customer specification with new software. Price: On request! Setup and commissioning possible! We can make you a detailed offer! Note: Our offer is aimed exclusively at professionals! (Changes and errors in the technical data, information and prices and subject to prior sale!)

Condition: good (used), Technical data Technical data coming soon. The machine can be upgraded to customer specification with new software. Price: On request! Setup and commissioning possible! Prodpfx Aedl Hdmsa Ejf We can make you a detailed offer! Note: Our offer is aimed exclusively at professionals! (Changes and errors in the technical data, information and prices and subject to prior sale!)

Year of construction: 1998, condition: excellent (used), machine/vehicle number: 105324, Technical data Manufacturer: ZEISS Type: Carmet C 160 418163 Year of manufacture: 1998 Serial number: 105324 Weight: 400 kg Measuring plate X = 6000 mm Y = 3000 mm Measuring range X = 5000 mm Podpfshy Tc Rox Aa Ejrf Y = 2600 mm Z = 2100 mm The machine can be modernized with new accessories according to the customer's requirements. Price: on request! Assembly and commissioning possible! We will be happy to provide you with a detailed offer. Note: Our offer is intended exclusively for professional customers. (Changes and errors in the technical data, specifications and prices and prices as well as subject to prior sale).

Year of construction: 2001, condition: excellent (used), Technical data Manufacturer: ZEISS / Stiefelmayer Type: SMM C Year of manufacture: 2001 Measuring range Prsdpfxjiwurcj Aa Ejf X = 12000 mm Y = 2 x 1400 mm Z = 2100 mm Measurement uncertainty U3 = (50 + L/40) µm

Year of construction: 1999, condition: excellent (used), machine/vehicle number: 105220 / 105221, Technical data Manufacturer: ZEISS & Stiefelmayer Type: SMM C Year of construction: 1999 Measuring plate Length = 6000 mm width = 2500 mm Weight = approx. 10 t Equipment 2 SMM stands incl. RDS heads Control cabinets 2 ZEISS Dynalog P3 control panel Climbing aid left and right The machine can be upgraded with new accessories according to customer requirements. Price: on request! Predpfx Ajfrbg Isa Ejf Installation and commissioning possible! We would be happy to provide you with a detailed offer. Please note: Our offer is directed exclusively to professional customers. (Changes and errors in the technical data, information and prices and subject to prior sale)

Condition: good (used), machine/vehicle number: 565301951 / 565201951, Accessories Actuators BWF SII 40 pieces Measuring system Renishaw Measuring plate 1 X = 8100 mm Y = 1750 mm Z = 300 mm Measuring plate 2 X = 8100 mm Y = 2000 mm Z = 300 mm Measuring volume X = 7300 mm Y = 1600 mm Z = 2800 mm The machine can be upgraded to customer specification with new software. Price: On request! Prsdpfsdfddzsx Aa Eof Setup and commissioning possible! We can make you a detailed offer! Note: Our offer is aimed exclusively at professionals! (Changes and errors in the technical data, information and prices and subject to prior sale!)

Year of construction: 2008, condition: excellent (used), ZEISS ACCURA 16.24.10 RDS-CAA X 1,600 / Y 2,400 / Z 1,000 RDS CAA touch probe with VAST XXT technology Stylus changing system 8 positions Control C99 Software on request - Calypso / HolosNT Warranty 12 months Installation, commissioning, acceptance according to DIN EN ISO 10360-2,4,5 Prodponp Hvuefx Aa Eof

Condition: ready for operation (used), Zeiss 608093 9203 ÄZ02 35/05 Path measurement 32 Prismo / Wegmessung 32 Prismo-ST 608093-9203-701, used, as good as new condition, 100% functional Predsxtwf Uepfx Aa Ejf

Condition: used, This listing is for a Zeiss Stemi DV4 Microscope Podpfx Aexzh T Sea Eorf

Condition: used, Year of construction: 1997, y-travel 850 mm z-travel 600 mm y-travel 700 mm weight of the machine ca. 3,7 t Predpswhf D Rofx Aa Eof dimensions of the machine ca. 1,6x1,6x3,1 m

Condition: used, functionality: fully functional, machine/vehicle number: 14324, Equipment: documentation/manual, lighting, For sale: Zeiss Jena Workshop Microscope WEMI – Large Version – with various accessories Offered for sale is a Zeiss Jena large workshop microscope, type WEMI, suitable for precise inspection and measurement applications in metalworking, toolmaking, quality control, and education. This robust and stable workshop microscope is renowned for its high optical quality and reliability. Thanks to its large design, the system is particularly suitable for inspecting larger workpieces with high precision. Specifications and features: • Manufacturer: Zeiss Jena • Type: WEMI (Werkstattmikroskop) • Model: Large workshop version • Very stable cast iron construction • High-quality Zeiss optics • Suitable for measurement, inspection, and visual control • Fine and precise focusing • Original operation manual included Accessories (including): • Various objectives • Eyepiece(s) • Analog measuring device • Illumination • Additional accessories as shown Condition: • Used, in good working order • Optics clear and undamaged • Normal signs of use consistent with age Prodpfx Aasx Ivr Eo Eef Delivery: • Includes all accessories as shown Price: • On request Location: • Klazienaveen, Netherlands If you are interested or require additional information, photos, or a viewing, please feel free to contact us via Machineseeker.

Condition: not inspected (used), functionality: unexamined, measuring range X-axis: 800 mm, measuring range Y-axis: 1,400 mm, measuring range Z-axis: 500 mm, table width: 1,170 mm, table length: 2,120 mm, No reserve price – guaranteed sale to the highest bidder! The machine is being auctioned as part of a site closure. Bidding obliges the buyer to collect the machine within the specified timeframe: from 26.01.2026 to 29.01.2026! TECHNICAL DETAILS Prjdpsxqqkfjfx Aa Eef Travel X-axis: 800 mm Travel Y-axis: 1,400 mm Travel Z-axis: 500 mm Worktable dimensions: 2,120 x 1,170 mm Magnetic chuck dimensions: 600 x 200 mm MACHINE DETAILS Dimensions & weight Dimensions (L x W x H): 3,000 x 2,400 x 3,500 mm Weight: 7,000 kg EQUIPMENT Magnetic clamping plate Workshop drawer cabinet with contents Various measuring tools (measuring pins and touch probe) Additional suitable accessories

Condition: ready for operation (used), Year of construction: 2018, This 3-axis ZEISS Contura 10/12/6 was manufactured in 2018. It features a Vast XT gold probe and axis travel dimensions of 1000 x 1200 x 600 mm. The scope of delivery includes a PC and probe. If you are looking to get high-quality measuring capabilities, consider the ZEISS Contura 10/12/6 machine we have for sale. Contact us for more information. Podpfxsx H U Aae Aa Eerf Application Types Measuring

Condition: excellent (used), Zeiss Coordinate Measuring Machine Model: O-INSPECT 442 Machine Designation: Coordinate Measuring Machine Machine Type: O-INSPECT 442 The multisensor measuring machine O-INSPECT ZEISS enables optimal optical or contact measurement of all features. The CALYPSO software simultaneously displays the actual state, nominal profile, and deviations, making measurement results easy to identify and interpret. General Data: Dimensions: Width 1055 mm, Length 1351 mm, Height 1770 mm Measuring range: X 400 mm, Y 400 mm, Z 200 mm Weight: CMM 800 kg Workpiece, max. 20 kg CMM noise level < 70 dBA Electrical Data: Supply voltage: 100, 110, 120, 125, 230, 240 V~ (± 10 %) Current type: 1 / N / PE Frequency: 50 to 60 Hz (± 3.5 %) Power consumption: max. 1500 VA Fuses: At 230 V or 240 V: 16 A At 100 V or 125 V: 15 A Travel Speeds: Creep speed, SLOW function: 0 to 5 mm/s Setup mode: 0 to 70 mm/s Automatic measurement: Axis (X, Y) max. 200 mm/s Axis (Z) max. 50 mm/s Axis (3D) max. 287 mm/s Pjdpjw Titljfx Aa Eorf Ambient Conditions: The following conditions must be met for proper operation of the measuring machine. Operating ambient temperature: +17°C to +35°C Relative humidity: 40% to 70% (non-condensing) Room temperature for measurement: 20°C ±1 K Altitude above sea level: 100–125 V: max. 3000 m 230–240 V: max. 2000 m Probe System: Probe System: CFS Probe Types Data: Probe Type: CFS 2 mm Measuring range: 2 mm, Working distance: 61 mm, Spot diameter: 12.5 µm Measurable surface angle to beam direction: 90 ± 15° Measuring range: 3 mm, Working distance: 22.5 mm, Spot diameter: 12 µm Measurable surface angle to beam direction: 90 ± 30° Measuring range: 10 mm, Working distance: 70 mm, Spot diameter: 24 µm Measurable surface angle to beam direction: 90 ± 20° The values for surface angles are limit values and depend on the reflectivity of the workpiece surface. Rotary Table: Mass and resolution Table weight: 7 kg Resolution: 0.15’’ Dynamics: Angular speed max: 50°/s Rotational speed: 8.3 min⁻¹ Scope of Delivery: In the standard version, the O-INSPECT coordinate measuring machine is supplied with the following components: - Coordinate measuring machine (CMM) - Controller (integrated) - Control panel - PC with peripherals - Software - CALYPSO 5.2 - Documentation - Probe system - Reference stylus - Calibration artifact - Calibration template Scope of delivery: (Zeiss coordinate measuring machine as shown) Condition: used (Specifications subject to change and errors excepted!) Please inquire about transport options prior to purchase. If you have further questions, we are happy to assist you by phone.

Condition: used, This listing is for a Zeiss Axioskop Microscope No Abjectives included Psdpjxzh Trefx Aa Eorf

Condition: good (used), Year of construction: 2012, functionality: fully functional, measuring range X-axis: 400 mm, measuring range Y-axis: 400 mm, measuring range Z-axis: 200 mm, travel distance X-axis: 400 mm, travel distance Y-axis: 400 mm, travel distance Z-axis: 200 mm, input voltage: 230 V, Equipment: lighting, type plate available, Year of manufacture: 2012 Tactile: Vast XXT E0 X/Y (1D) in [μm] at 20 ±2 °C 1.7 + L/250 E0 XY (2D) in [μm] at 20 ±2 °C 1.7 + L/250 E0 (3D) in [μm] at 20 ±2 °C 1.9 + L/250 Scanning probing deviation MPE according to ISO 10360-4:2000 THP at 2.7 [μm] Single probe probing deviation form MPE according to ISO 10360-5:2010 PFTU 1.9 [μm] Camera system: Zeiss Discovery 12 EB X/Y (1D) 5) in [μm] at 20 ±2 °C 1.7 + L/250 EB XY (2D) 5) in [μm] at 20 ±2 °C 1.7 + L/250 Probe deviation MPE according to ISO 10360-7:2011 PF2D 5) 1.7 [μm] Probe deviation of the image processing system Prjdpsuq Nfhjfx Aa Eof MPE according to ISO 10360-7:2011 PFV2D 5) 1.2 [μm] Possible services: delivery, commissioning

Condition: excellent (used), Zeiss stylus kit in very good condition Predpfxjurlqcs Aa Esf

Condition: used, Zeiss Type: EVO 50 XVP The instruments of the EVO product family combine powerful scanning electron microscopy with an intuitive operating concept that is equally well suited to experienced users and novices. Thanks to its extensive options, EVO can be precisely tailored to your requirements, regardless of whether you work in the life sciences or materials science or in routine industrial quality control and failure analysis. Scanning electron microscope EVO 50 XVP, EDX from Oxford Xplore 30 SDD detector without N cooling 05/2021 Dimensions: DxLxH 930 x 1930 x 1600 mm 30mm 2 sensor size / resolution 129MnKa at 100,000cps From boron - califonium Software AZtec lite on Windows 10 With drift correction Prodpfx Aaevvtnbo Eef Analyser quali-quanti-analysis Point ID Mapping Line scan Damping system included each container carries 116kg/bar Operating hours approx. 11,500 hours PC upgrade to Windows 10 05/2021 The scanning electron microscope is fully functional. Weight 750 kg + 385 kg +150 kg Condition: used (Changes and errors in the technical data, information are reserved!) Please ask about the transport options before purchasing. We will be happy to answer any further questions you may have over the phone.

Condition: used, This listing is for 1 of 2 Zeiss Standard 20 Microscope Prsdsxzh Tfopfx Aa Ejf

Condition: excellent (used), ZEISS Type: DSM 962 The digitized scanning electron microscope DSM 962 is equipped with an integrated 4 MB image memory, a 40 MB hard disk for internal image storage and drives for external storage of data and images. Podofcwwnopfx Aa Esrf hard disk for internal image storage and drives for external storage of data and images. This makes it possible to quickly and easily gain insights into the composition and morphology of morphology of specimen surfaces far into the sub-micrometer range. With magnification range from 5x to 300,000x, both macrostructures and microstructures can be examined. as well as microstructures is possible. The range of applications can be extended considerably by adding special accessories, allowing, for example analytical investigations in micro areas of the surface are possible. The device can be operated both via conventional switching elements and via the keyboard or mouse (add-on). or mouse (add-on). Electron optics and vacuum control are conventional. Functions of the Image memory functions are operated using the keyboard or mouse (add-on). A separate information screen is located centrally on the separate information screen for displaying the menus. These operating instructions are intended as a guide to help the user achieve the best possible results with the device. results with the appliance. The explanations have been kept as simple as possible so that even a less experienced user less experienced users the necessary tools. Magnification range: 20x to 300,000x at 7 mm working distance Stages in a sequence of 1-2-3-5-10 Minimum magnification: 5x at 50 mm working distance Resolution: 4 nm - guaranteed with tungsten cathode at 30 kV, 6 mm working distance, untipped specimen 25 nm - guaranteed with tungsten cathode at 1kV, 6 mm working distance, untipped specimen 3.5 nm - guaranteed with optimal LaB6 cathode at 30 kV, 6 mm working distance, untilted specimen Scope of delivery: (DSM 962 with accessories as shown) Condition: used (Subject to changes and errors in technical data and specifications) Please ask about transportation options before purchasing. We will be happy to answer any further questions you may have over the phone.

Condition: used, This listing is for a Zeiss Standard 15 Microscope Predpfx Aasxzg Tqj Eef Objectives F2,5/0,08 F10.25 F40/0,65

Condition: used, This listing is for a Zeiss Axioskop EL-Einsatz 5 Objectives Microscope. The unit is in full working condition and is ready for immediate release. Objective Lenses supplied: Plan 100/1.25 Plan 40X/0.66 Plan 20x/0.40 Achroplan 10x/0.25 SPL10/0.25 Zeiss Axioskop EL-Einsatz 5 Microscope Overview The Zeiss Axioskop EL-Einsatz 5 microscope is a sophisticated instrument designed for advanced microscopy tasks, particularly in research and clinical settings. Its range of objective lenses and features supports high-quality imaging and user-friendly operation. Key Features: Water Immersion: These objective lenses are designed for application in physiological salt solutions, making them perfect for examining thick biological specimens, such as brain sections. High Numerical Aperture (NA): The lenses feature high NA values (e.g., 0.80 for the 50x lens), enhancing light-gathering capability and image resolution, especially beneficial for fluorescence microscopy. Fluorescence Capabilities: The Axioskop EL-Einsatz 5 can capture fluorescent images across four channels. The system automatically adjusts brightness and white balance, simplifying the imaging process. Ergonomic Design: With an adjustable ergotube, users can comfortably position the eyepieces for extended use. Essential controls are conveniently located for ease of access. Smart Microscopy: The microscope is built for efficiency, featuring automatic adjustments that minimize the need for manual intervention, streamlining workflow. Pedpfx Aoxxzlisa Eorf Applications: The Zeiss Axioskop EL-Einsatz 5 is suitable for a variety of applications, including: Materials Science and Metallography: Ideal for examining the microstructure of materials and conducting failure analysis. Physiology and Electrophysiology: Great for observing living cells and tissues, understanding physiological processes in real-time. Biomedical Research and Clinical Diagnostics: Useful for analysing biological samples, including histological sections and cultured cells, contributing to disease research and diagnostics. Microscopy Tasks Requiring Advanced Imaging Capabilities: Perfect for researchers needing high-resolution images and automation in their microscopy tasks.