Used Zeiss Axio Microscope Inspection Setup for sale (16,954)

Year of construction: 2023, condition: ready for operation (used), Automatic 3D XRAY with laser option for Z reference, without calibration plate from 01/2023 with 1500 h. Bsdpfxozuwwyo Ac Tswt

Condition: used, TECHNICAL DETAILS Bwjdoug U Rgepfx Ac Tot - Objectives : 1.5X et 0.5X - Light : OLYMPUS HIGHLIGHT 3001

Condition: used, TECHNICAL DETAILS Bwedpeug U Rtjfx Ac Tet - Magnification : 6,4-10-16-40 - W 10/23

Condition: used, TECHNICAL DETAILS - Magnification : W 10 x 21 B Bjdpfx Aoug U Rmec Tjwt

Condition: good (used), Measuring microscope, universal workshop measuring microscope, microscope -Manufacturer: Leitz Wetzlar, universal workshop measuring microscope -Reading accuracy: see photos -Dimension assembled: 255/245/H470 mm -Quantity: 1 pieces available -Price per piece -Dimensions transport box: 710/230/H155 mm -Total weight: 35.4 kg/pc. Bjdpfeh Tadpjx Ac Towt

Year of construction: 2017, condition: used, Setup station, pallet changing system, pallet changer, pallet storage, tool changer chain, chain magazine, tool changing system, tool magazine Bwedpfx Acoflk Hpe Tjt -Setup station with: Garant ZERO CLAMP G-11886 -Manufacturer no.: 101545300002672 - 21063 1721559 -Dimensions: 400/400/H810 mm -Weight: 232 kg

Condition: ready for operation (used), AUTOMATIC COLOR AND IMAGE CONTROL INTELLIGENT QUALITY OPTIMIZER For Konica Accurio Press c4080/C4070/C12000/C14000 In perfect condition! For more details, please refer to the attached PDF document. IQ 501 UK 301 VI 513 RU 502 VI514 As an experienced retailer of used copiers, we have developed significant expertise in packing and pallet shipping, ensuring that our customers receive machines in perfect condition. We ship copiers that originate from and are maintained by Konica Minolta France. If you have any questions, please do not hesitate to ask. Bodpfx Acsyx U Efo Tjwt Our company offers the widest range of Konica Minolta production copiers and can handle worldwide deliveries upon request. Please do not hesitate to contact us for further information.

Year of construction: 2019, condition: good (used), LEICA DMi1 Leica HI PLAN I 20x/0.30 PH1 objective lens Leica HI PLAN I 10x/0.22 PH1 objective lens Leica HI PLAN 4x/0.10 objective lens Leica S40 slider, ref. 11526113 Bjdpjzhib Rsfx Ac Towt Leica S40/0.45 condenser Leica HC PLAN S 10x/20 eyepiece(s) Leica MC120 HD camera Digital screen for live viewing and image analysis.

Condition: good (used), Olympus CKX53SF inverted microscope, suitable for cell culture, live cell observation, and general laboratory use. This configuration is equipped with integrated phase contrast (iPC) and comes with multiple objectives and various accessories. Configuration: UPLFLN4xIPC/0.13 objective CACHN10x IPC/0.25 objective LCACHN20xIPC/0.40 objective LCACHN40xIPC/0.55 objective 10X/22 eyepiece CKX3-SLP pre-centered phase contrast slider Various accessories, including coverslip platforms, sliders, and additional accessories. Bwedpszhidfofx Ac Tst Features: Inverted microscope, ideal for cell culture applications. iPC phase contrast for fast and high-contrast observation. Professional Olympus platform, compact and well-suited for laboratory environments.

Year of construction: 2020, condition: good (used), Well-maintained Leica DM IL LED Cellfactory inverted microscope, suitable for cell culture, phase contrast, and routine live-cell observation. Configuration: HI PLAN 4x/0.10 PH0 objective HI PLAN I 20x/0.30 PH1 objective Bwodpfxozhia Hj Ac Tst HI PLAN I 20x/0.30 PH1 objective HI PLAN I 40x/0.50 PH2 objective S40/0.45 Leica condenser (521251) HC C-mount 0.50x Slider HC Plan 10x/20 eyepiece(s) Flexacam C1 with remote control Various accessories A robust setup for laboratories, biotechnology, research, and cell culture applications.

Year of construction: 2017, condition: used, Specifications Optics: infinity-corrected optical system, RMS-threaded objectives with 45mm parfocal distance Objectives: LPlan PH2 10X/0.25 - LPlan PH2 4x/0.13 - LPlan PH2 20x/0.40 Illumination: adjustable intensity LED (>50,000-hour lifespan per light cube) Contrast methods: transmitted light (brightfield and phase contrast) Objective turret: 4-position, manual control Condenser: 3-position turret for brightfield and phase contrast Condenser working distance: 60mm Stage: fixed stage Focus mechanism: coaxial focus knobs with tension control Coarse focus: 38mm/revolution Fine focus: 0.2mm/revolution, precision 0.002mm LCD display: 12.1 in. high-resolution (1024 x 768 pixels) color monitor with adjustable tilt Camera: Color, 1/2 in. 2048 x 1536 pixels, 3.1 megapixels Image acquisition: embedded operating system with software for image capture and saving via mouse or front-mounted manual buttons Captured images: color camera; 24-bit full color; TIFF, PNG, jpeg, bmp; 2048 x 1536 pixels Output ports: Two USB 2.0 ports Power supply: AC adapter; input 100-240V, 47-63 Hz; output 12 VDC/2.0A 24W max Dimensions: 40.6 x 31.8 x 53.3cm (6 x 12.5 x 21 in.) Bodszh Rd Hjpfx Ac Tewt Weight: 9.1kg (20.1 lb.)

Condition: excellent (used), Type: Jeol JSM-6490 Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive, graphical user interface (GUI) running on Microsoft Windows XP Professional. Instrument configuration includes the following features: • Magnification range: 5x – 300,000x • Acceleration voltage: 0.3 – 30 kV • Tungsten filament cathode (LaB6 cathode optional) • Large fully motorized sample stage with eccentric tilt capability, including: – Graphic navigation on the sample holder – Easy sample navigation via click-center-zoom – Field-of-view controlled navigation via two navigators – Relative coordinate navigation – Save and recall of sample positions – Adjustable stage field-of-view selection • Field-of-view correction during rotation via computer-driven eccentric rotation • Field-of-view correction during tilting via computer-driven eccentric tilting • Calculation of the possible tilt angle based on sample geometry • Automatic focus tracking when moving the sample in the Z-axis • Intelligent limit switches for all motorized axes • Stage travel: X = 125 mm Y = 100 mm Z = 5 to 80 mm (stepless) T = -10°C to +90°C R = 360° (continuous) • Secondary electron detector for high vacuum operation • Newly designed, super-conical objective lens for optimal resolution at high tilt angles • Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV • Simultaneous live imaging with multiple detectors • Powerful image measurement functions • Movie function for recording dynamic processes • Versatile specimen chamber with numerous expansion options: free ports for EDX, WDX, EBSD, cathodoluminescence, etc. • Low-maintenance, quiet pump system consisting of a fore vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control • Comprehensive safety procedures against misuse and external media failure • Ergonomic, height-adjustable system table • SEM starter kit including 2 sample holders, tool kit, and 6 replacement filaments Additional equipment for SEM: • Turbomolecular pump (instead of standard diffusion pump) – Use of a turbomolecular pump eliminates the need for cooling water during SEM operation. Further SEM equipment: • PC for SEM control including TFT monitor • ΟΧ200 Bruker Quantax 200 Extended EDX System – Bruker EDX software will be transferred to new owner upon purchase Bjdpfx Aozd Ufasc Tjwt • Nitrogen-free, energy-dispersive X-ray analysis system including: – SDD detector with 127 eV energy resolution or better – Detection for all elements from boron upwards – Vibration-free, maintenance-free. Peltier cooled (no nitrogen required) – Pulse processor – TFT monitor – Spectrum measurement and element identification – Fully automatic, quantitative, standardless elemental analysis – Image acquisition – Ultra-fast qualitative line scan – Ultra-fast qualitative element mapping – Data management and archiving system – Report generation and results output – Data communication – Installation and user training – HyperMap – Multipoint analysis – Bruker xFlash detector (SDD) with signal processing unit SVE III Scope of delivery: (see photos) Condition: used (Subject to changes and errors in the technical data and specifications!)

Condition: excellent (used), TAMAR Type: FEMET_WI_ID071_TAMAR PLMIS Optical Microscope Optical Microscope The TAMAR optical microscope ID071 is used for the optical inspection of samples with a maximum size of approximately 780x650mm2 (substrate size) in the PLG cleanroom. Substrate size: complete substrate size (780x650mm2) Objective: The objective lens focuses the light emanating from the object being observed to create a real image for the viewer. Brightfield mode (BF): Light from the microscope is directed through the objective lens onto the sample. High resolution, low contrast Darkfield mode (DF): Illumination mode for increasing contrast, high contrast for edges and particles. Principle: The center of the incident light beam is blocked, and only peripheral light is directed through the objective lens and strikes the sample from the side. This causes edges and particles to appear bright, while the smooth background appears dark. TAMAR Optical Microscope ID071 X-Y Stage Software Revision 1.0 Condition: used Bwedpfxezd Sqms Ac Tot Scope of supply: (autosampler as shown in the picture) (Changes and errors in the technical data are subject to change!) We will be happy to answer any further questions you may have by telephone.

Condition: excellent (used), Shimadzu Type: Prestige-21 / with AIM-8800 Infrared Microscope Shimadzu IR Prestige-21 Infrared Spectrophotometer The IRPrestige-21 is designed for both highly sensitive and broad applications in the fields of research and development. It is an excellent addition to the existing FTIR series, which covers, among other things, the standard laboratory area. AIM-8800 Specifications Optics: 15x Cassegrain objective lens 15x Cassegrain condenser mirror with inlet for purging MCT detector: with liquid nitrogen monitoring system Wavelength range: Type 1 - 5000 - 720 cm-1 Type 2 - 5000 - 650 cm-1 Electrically activated aperture XY Θ directional drive. Adjustment of the XY directional increments is 1 µm above the sample surface and 1° steps in the Θ direction (numerical input possible). Minimum adjustment value: 3µm Motor-driven XY sample stage Positioning range: X-axis: 70 mm; Y-axis: 30 mm Resolution: 1 µm spacing Sample thickness: Reflection mode - ≤ 40 mm Transmission mode - ≤ 10 mm Bwodpjzdyyiofx Ac Tot Operation via the main unit's keyboard Selection of the measurement mode / XY stage operation (speed control in 4 steps) / manual focusing / illumination control (Optional) Control via PC Selection of the measurement mode / XY stage operation / automatic centering / manual focusing / automatic focusing / illumination control / Aperture adjustment / aperture preview / measurement position and recording of the aperture setting (10 sample positions, 2 background positions) Environmental conditions: Ambient temperature: 15°C ~ 30°C Humidity: 70% or less External dimensions, weight: W410mm x D540 mm x H520 mm x 36kg Condition: used Scope of supply: (See image) (Changes and errors in the technical data and information are subject to change!) We will be happy to answer any further questions you may have by telephone.

Condition: excellent (used), Here, we offer you an inspection system for crystalline silicon solar modules. Reliable quality assurance and process control throughout the entire solar module production. The Dr. Schenk SolarInspect series was developed to meet the specific requirements in the production of crystalline silicon solar modules. These ready-to-use vision systems provide reliable quality control for the entire ongoing production process. Furthermore, continuous monitoring of the production process allows for timely corrective measures to be taken in the event of process deviations. In the production of crystalline silicon solar modules, textured glass substrates are used instead of uncoated glass. Textured glass increases the transmission of sunlight. The optical signals in the vision system, triggered by the surface structure typically used for glass substrates in silicon solar modules, are often similar to or even stronger than those of the actual defect being inspected. Dr. Schenk has developed and manufactured SolarInspect, a system that specializes in the precise differentiation between glass structure and defects on the entire material surface, including the edges. Thanks to an innovative optical design, Dr. Schenk's inspection system can clearly detect glass defects and distinguish them from the glass structure. Reliable inspection of: - Uncoated incoming glass - Uncoated textured glass - Coated glass, e.g., AR (anti-reflective) coated - Layer application - Finished modules Detection of: - Sheet glass defects, e.g., bubbles, inclusions, scratches - Dimensions - Edge defects - Layer defects, homogeneity and thickness of AR-coated glass SolarInspect - Exceptional performance features: - Innovative and modular optical design - Low operating costs - Ready-to-use vision systems optimized for specific process step requirements Bwsdpfxszdtgie Ac Tjt - Customized solution for all types and sizes of solar modules - Repeatable detection and evaluation - User-friendly quality and analysis tools for production control and process analysis - Easy integration into new and existing lines - Industrially proven design Type: SolarInspect Condition: used Sale is ex works. Scope of delivery: (See image) (Changes and errors in technical data and specifications are subject to change!) We will gladly answer any further questions you may have by telephone.

Condition: excellent (used), Microscope Magnifying glass Manufacturer: Hartmann Type: Accu Lux 20x magnification Bwodpfxod Iacwj Ac Tst in a wooden box with operating instructions

Condition: good (used), Year of construction: 2013, functionality: fully functional, machine/vehicle number: Nr. 291, used inline automatic 3D solder paste inspection system (AOI) for SMT. Fault description: Error in solder paste printing. Year of manufacture 2013 used inline automatic 3D inspection system (AOI) for assembled PCBs. Faults: Component misplacement, bent pins, etc. Multiple units available. Years of manufacture 2013–2016 Bsdpfx Aew Dfh Ijc Tswt ----- Please quote your offer price. Sale only within Europe (EU), including Turkey, the United Kingdom, and Switzerland ----- Technical specifications according to handout. No packaging; any warranty rights are excluded. If you intend to dismantle the equipment yourself, please indicate this accordingly in your bid. We assume no liability for the accuracy of the technical data, for the completeness of accessories and tooling, or for compliance with all safety and environmental protection requirements specified in accident prevention regulations.

Condition: good (used), Year of construction: 2016, functionality: fully functional, Please provide us with your offer price. Sale only within Europe (EU), including Turkey; United Kingdom, Switzerland. Technical data can be found in the handout. No packaging; any warranty rights are excluded. If you intend to dismantle the system yourself, please indicate this in your offer. Bwjdpew Dfqpjfx Ac Tst We do not assume any liability for the accuracy of the technical data, for the completeness of accessories and tooling, nor for compliance with all safety and environmental protection requirements as stated in the accident prevention regulations.

Condition: good (used), Year of construction: 2014, functionality: fully functional, machine/vehicle number: Nr. 011, used inline automatic 3D solder paste inspection system (AOI) for SMT. Error pattern: Defective solder paste printing. Multiple machines available, year of manufacture 2011 – 2015. used inline automatic 3D inspection system (AOI) for populated PCBs. Fault types: Misplaced components, bent pins, etc. Several machines available, year of manufacture 2013 – 2016. Please submit your offer price. Bedpfx Acowzv Adj Towt Sale only within Europe (EU), incl. Turkey, Great Britain, and Switzerland. Technical specifications can be found in the handout. Sold without packaging; any warranty or guarantee is excluded. If you intend to dismantle the system yourself, please mention this in your offer. We do not assume any liability for the correctness of the technical data, for the completeness of accessories and tooling, or for compliance with the safety and environmental protection requirements specified in accident prevention regulations.

Condition: good (used), Year of construction: 2015, functionality: fully functional, machine/vehicle number: Zeile 270, used inline automatic 3D X inspection system (AOI) for assembled PCBs. Defect types: misalignment, bent pins, etc. Multiple units are available, manufactured between 2013 and 2016. ----- Please indicate your offer price. Sale only within Europe (EU), including Turkey, United Kingdom, and Switzerland. ----- Technical specifications can be found in the handout. Bodpfxjwzv Ite Ac Tjwt Without packaging; all warranty rights are excluded. If you intend to dismantle the equipment yourself, please mention this in your offer. We make no guarantees regarding the accuracy of technical data, completeness of accessories and tooling, or compliance with all safety and environmental protection requirements as outlined in accident prevention regulations.

Condition: used, This Listing is for 1 of 2 Leitz Laborlux K Microscope, one still in box Bwedpfx Acoxzh T Ee Tot

Condition: used, This Listing is for a Leitz Dialux 22EB Microscope 120/230V, 50-60 Hz Bwsdoxzh Uijpfx Ac Tet

Year of construction: 2005, condition: used, functionality: unexamined, machine/vehicle number: X-1802, Used Andor Ixon DV885JCS-VP microscope camera in a case. Bodezgtnfepfx Ac Tjwt Manufacturer: Andor Technology Model: (Ixon) DV885JCS-VP Includes software, power supply, connection cables, and system PCBs.

Condition: used, functionality: unexamined, machine/vehicle number: SX-50, Used Cameca SX-50 Electron Microprobe Cameca SX-50 electron microprobe is used (Electron Probe MicroAlalyses). it has a 6” inch stage, 3 WDX Spectrometers with several Cristals LiF, PET, TAP, ODPb, PC1, PC2, PC3. Electron probe microanalysis (EPMA) are generally considered micro-analytical techniques which are able to image or analyze materials we can not generally observe with the resolution offered by visible techniques System is complete with all Books, service Manuals, Software and computer. Also many parts. Bsdjwnb D Tjpfx Ac Tjwt 1 x Leybold Trivac D16B Vacuum Pump 1 x Alcatel 2012 A Vacuum Pump 2 x integrated Turbo Pumps

Condition: used, This listing is for a MOTI stereomicroscope with Moticam 480 camera and underlit plate. SELLERS NOTICE: If you have a competing quote for the item, we will always try to beat it. Items are ‘sold as seen’. ID: FFTF043 Bedsxzicbjpfx Ac Tjwt Listing name: MORTI Stereo Microscope